CVmap92-A  1.34    Four Dimensions, Inc.

Doping

Sample Identification
**********************
User                  :	eng
Wafer ID              :	VERIF-7
Lot                   :	
Equipment             :	
Fab                   :	
Description           :	MOOV-VERIF
Wafer Size(mm)        :	100
Measuring Date        :	07-29-2025
Measuring Time (Start):	12:59:31
Measuring Time (End)  :	13:13:15
Current Date          :	07-29-2025
Current Time          :	13:28:56

Measurement method
******************
Method        :	VERIFICAT
Sites         :	13
External      :	No
Contact type  :	Back/Dot
Light value   :	0
Area(sq cm)   :	0.020700
C type for Cox:	Ch/Cd
K             :	3.840

Result
******
Mean (cm-3)        :	1.177E+016
Std Dev (cm-3)     :	2.936E+014
Mean percentage   :	2.494E+000
Min (cm-3)         :	1.133E+016
Max (cm-3)         :	1.248E+016
Temp.(C)          :	22.512
Contour percentage:	5.00000 

Displayed Site Values
*********************
Site#	X	Y	Doping(cm-3)  
0	0.00000	-40.000	1.209E+016
1	0.00000	-30.000	1.160E+016
2	0.00000	-15.000	1.153E+016
3	0.00000	0.00000	1.155E+016
4	0.00000	45.000 	1.248E+016
5	-45.000	0.00000	1.172E+016
6	-30.000	0.00000	1.189E+016
7	-15.000	0.00000	1.133E+016
8	15.000 	0.00000	1.168E+016
9	30.000 	0.00000	1.170E+016
10	45.000 	0.00000	1.182E+016
11	0.00000	15.000 	1.166E+016
12	0.00000	30.000 	1.201E+016